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Explores stencil lithography, a high-resolution direct patterning technique, and its applications on flexible substrates, dynamic stenciling, and biopatterning.
Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.
Explores proximity effect corrections in electron beam lithography for small and large features, emphasizing the importance of beam point spread function modeling.
Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.