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Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Introduces EBSD and ESEM, covering acquisition, sample preparation, indexing, applications, and data analysis, along with the operation and benefits of ESEM.
Discusses the radiative properties of particles, focusing on Rayleigh and Mie scattering theories and their applications in understanding light behavior.
Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
