Concept
Pixel
Related lectures (72)
Advanced SEM Technologies and Examples
Explores advanced SEM technologies, low voltage imaging, high-resolution SEM, and analytical capabilities with practical examples.
Scanning Electron Microscopy Basics
Covers the basics of Scanning Electron Microscopy, including working principles, image generation, signal production, and challenges.
Edge and Contour
Covers edge and contour detection in images, including gradient-based methods, Laplacian operator, and more complex methods.
Detectors: Cameras and Performance
Explores imaging cameras' characteristics, spatial resolution, noise sources, and dynamic range for optimal performance in microscopy applications.
Snow Remote Sensing: Satellite Missions and Spectral Properties
Explores satellite missions and spectral properties for snow remote sensing applications.
Detectors: Types and Operation
Explores various microscopy detectors, their structures, and applications in digital imaging systems, emphasizing low-light imaging and CMOS technology advantages.
Image processing: Basics and 3D Reconstruction
Explores image processing in 2D and 3D, covering ideal imaging conditions, histogram analysis, tools, 3D reconstruction steps, and visualization.
Shape from Stereo-1
Explores geometric stereo, epipolar geometry, correlation methods, occlusions, and real-time implementation challenges in stereo vision systems.
3D FIB/SEM Volume Reconstruction
Explores 3D volume reconstruction using FIB/SEM microscopy, particle recognition, edge detection, watershed separation, and quantitative microstructure analysis.
Image Processing: Segmentation and Measurements
Covers inverse Fourier transform, frequency filtering, segmentation, thresholding, particle size estimation, and analysis using ImageJ.