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Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores the interaction of radiation with matter, covering ionization, excitation, deexcitation, bremsstrahlung, Cherenkov radiation, and stopping power.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Showcases the advanced applications of the Scanning Tunneling Microscope beyond imaging, including spectroscopy for electronic properties and nanostructure assembly.
