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Explores the chemistry of silicon and carbon compounds, including conductivity differences, compound existence, carbon nanotubes history, and environmental impact of carbon dioxide.
Delves into the world of neural interfaces, focusing on the implementation of invasive and non-invasive electrodes and the evolution of electrode technologies.
Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.
Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.
