Concept

Corner reflector

Related publications (17)

Nano SAW Devices For Sensing Applications

The project consisted of two goals: to design and fabricate SAW sensors on lithium niobate chips with the best resolution photolithography in CMi and to study as many different devices as possible during the first fabrication runs to find the best layouts ...

2014

Backpropagation Imaging in Nonlinear Harmonic Holography in the Presence of Measurement and Medium Noises

Pierre Robert Maurice Millien

In this paper, the detection of a small reflector in a randomly heterogeneous medium using secondharmonic generation is investigated. The medium is illuminated by a time-harmonic plane wave at frequency ω. It is assumed that the reflector has a nonzero sec ...

2014

Behaviour of nodal regions of reinforced concrete frames subjected to opening moments and proposals for their reinforcement

Aurelio Muttoni, Miguel Fernández Ruiz, Stefano Campana

The strength and deformation capacity of concrete frames is typically governed by their nodal regions behaviour. This is particularly relevant for frame corners subjected to opening bending moments, where premature brittle failures may develop depending on ...

Engineering Structures2013

Advanced intermediate reflector layers for thin film silicon tandem solar cells

Christophe Ballif, Franz-Josef Haug, Matthieu Despeisse, Mathieu Gérard Boccard, Björn Niesen, Rémi Biron

Tandem solar cells based on thin film silicon benefit from an intermediate reflector layer between the top and bottom cells since it enhances the absorption in the top cell. The top cell can thus be manufactured thinner and less prone to light induced degr ...

2013

Method and apparatus to measure and compute the amplitude point spread function and associated parameters of a coherent optical imaging system

Christian Depeursinge, Tristan Colomb, Pierre Marquet, Florian Charrière, Mihaela Marian

The invention concerns a method of and an apparatus for the measurement of the Amplitude Point Spread Function (APSF), of an Optical Imaging System (OIS), wherein the APSF is defined as the complex field distribution of the beam delivered by the OIS and or ...

2008

Microcavity for optical telecommunication device, comprises two bragg reflectors separated by at least one semiconductor layer.

Benoît Marie Joseph Deveaud, François Morier-Genoud, Cristiano Ciuti

Microcavity comprising two reflectors, at least one semiconductor layer separating said reflectors and a semiconductor quantum well wherein at least one of said reflectors and of said at least one semiconductor layer comprises a structure which is adjusted ...

2006

Compositional model for predicting multilayer reflectances and transmittances in color reproduction

Mathieu Hébert

The color of materials such as paints, prints and glass may be characterized by a reflectance or a transmittance spectrum. Modeling their reflectance and their transmittance requires describing the interaction of light, from the light source to the observe ...

EPFL2006

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