Scanning Probe Microscopy: Self-Sensing Cantilevers

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Scanning Probe Microscopy: Forces, Tips, and Probes

Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.

Scanning Probe Microscopy: Fundamentals and Applications

Explores the fundamentals and applications of scanning probe microscopy techniques, including AFM, MFM, KPFM, and SNOM.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, conductance quantization, and scanning probe microscopy.

Nanotechnology: Fabrication and Imaging

Covers advanced lithography, nanoscale imaging, and fabrication techniques in nanotechnology.

Scanning Probe Microscopy: AFM Basics

Covers the basics of scanning probe microscopy, with a focus on the Atomic Force Microscope (AFM) and its operational principles.

Lithography: Nanoscale Patterning Techniques

Explores lithography fundamentals, nanofabrication challenges, and advanced patterning techniques for high-resolution production.

Focused Beam Lithography: E-Beam Basics

Explores UV and DUV lithography, electron beam lithography basics, resist materials, and optics, comparing EBL with other lithography methods.

Nanoscale MEMS or NEMS

Covers the transition to nanoscale devices, nanoscale imaging, capillary forces, AFM of graphene, and integrated sensors & actuators.

Advanced Nanomanufacturing: Lithography & Self-Assembly

Delves into advanced nanomanufacturing techniques, including lithography and block copolymer self-assembly for precise device fabrication.

Scanning Probe Microscopy: Fundamentals

Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.