Scanning Probe Microscopy: Fundamentals and Applications

This lecture covers the fundamentals and applications of scanning probe microscopy (SPM), focusing on techniques such as Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Kelvin Probe Microscopy (KPFM), and Scanning Near-Field Optical Microscopy (SNOM). The instructor explains the optimization of cantilever imaging bandwidth in AFM, the principles behind MFM for imaging magnetic domains, the use of KPFM for observing surface potential and work function, and the breakthroughs in SNOM for surpassing the diffraction limit. Additionally, the lecture delves into the integration of sensors and actuators for cantilevers, the fabrication and operation of piezoresistive and piezoelectric cantilevers, and the advancements in parallel SPM systems.