Transmission Electron Microscopy: Imaging and Diffraction

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Page 3 of 4

Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.

STEM & EDX

Covers the principles of electron microscopy, STEM, HAADF, EDX microanalysis, and applications in materials science.

Aberration Correction in HRTEM

Explains the principles of HRTEM, including contrast transfer, lenses, and aberration correction.

TEM Components and Operation

Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.

Tomography: Principles and Applications

Explores the principles and applications of tomography, showcasing examples of direct tomography and advanced imaging techniques.

STEM & EDX: Electron Microscopy Principles

Covers electron microscopy principles, detectors, and contrast mechanisms.

Microscope Lenses: Condenser and Objective

Explores the function of condenser and objective lenses in a transmission electron microscope.

STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Microscopy Resolution: Understanding Rayleigh Criteria

Explains microscopy resolution using Abbe's theory and Rayleigh criterion.