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Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
