Explores dynamical scattering in electron diffraction, discussing challenges in interpreting diffraction patterns and applications in crystal defect imaging and phase discrimination.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
