Design for Testability: Techniques and Hardware

This lecture covers the design for testability (DFT) techniques in VLSI systems, focusing on ensuring fault detection, reducing test development and execution time. It explores ad-hoc and structured DFT methods, scan design, and the operation of scan-path architecture. The presentation delves into the hardware requirements, scan layout procedures, and the evolution from traditional PCB testing to JTAG boundary scan. It also discusses the IEEE 1149.1-1990 JTAG standard, system test logic, and the TAP controller signals. The lecture concludes with an overview of boundary-scan cells, scan chain views, and types of instructions in the JTAG process.