Design for Testability: Techniques and Hardware

This lecture covers the design for testability (DFT) techniques in VLSI systems, focusing on ensuring fault detection, reducing test development and execution time. It explores ad-hoc and structured DFT methods, scan design, and the operation of scan-path architecture. The presentation delves into the hardware requirements, scan layout procedures, and the evolution from traditional PCB testing to JTAG boundary scan. It also discusses the IEEE 1149.1-1990 JTAG standard, system test logic, and the TAP controller signals. The lecture concludes with an overview of boundary-scan cells, scan chain views, and types of instructions in the JTAG process.

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Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test technique

JTAG

JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. It specifies the use of a dedicated debug port implementing a serial communications interface for low-overhead access without requiring direct external access to the system address and data buses.

Boundary scan

Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.

Very Large Scale Integration

Very large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (Metal Oxide Semiconductor) chips were developed and then widely adopted, enabling complex semiconductor and telecommunication technologies. The microprocessor and memory chips are VLSI devices. Before the introduction of VLSI technology, most ICs had a limited set of functions they could perform.

Test-driven development

Test-driven development (TDD) is a software development process relying on software requirements being converted to test cases before software is fully developed, and tracking all software development by repeatedly testing the software against all test cases. This is as opposed to software being developed first and test cases created later. Software engineer Kent Beck, who is credited with having developed or "rediscovered" the technique, stated in 2003 that TDD encourages simple designs and inspires confidence.

Integrated circuit

An integrated circuit or monolithic integrated circuit (also referred to as an IC, a chip, or a microchip) is a set of electronic circuits on one small flat piece (or "chip") of semiconductor material, usually silicon. Large numbers of miniaturized transistors and other electronic components are integrated together on the chip. This results in circuits that are orders of magnitude smaller, faster, and less expensive than those constructed of discrete components, allowing a large transistor count.

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