Technology Scaling and Trends

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Related lectures (31)

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VLSI Basics: Design and Technology

Covers VLSI design basics, including scaling, technology, MOSFET operation, and logic circuit implementation.

Contact Resistance: Theory and Measurements

Explores contact resistance in semiconductor devices, including Moore's Law, FET characteristics, quantum limits, and measurement techniques.

Logical Effort: Fundamentals of VLSI Design

Covers the Logical Effort method for optimizing logic delay and gate sizing impact.

Contacts: Semiconductor Devices II

Explores semiconductor devices historical development, contact resistance, FET characteristics, quantum limit, 2D materials contacts, and charge-injection mechanisms.

MOSFET Structure and Operation: Qualitative Analysis

Describes the qualitative behavior of MOSFET transistors, focusing on their structure and operational principles.

Introduction to Advanced VLSI Design

Covers Advanced VLSI Design concepts, including Full Custom Design and Parallel Prefix Adder.

Scaling Trends: Transistors, Power, and Hardware Evolution

Explores the evolution of hardware systems, from transistors to modern parallelism and the challenges of power limitations.

Digital Systems Overview: From Transistors to Integrated Circuits

Explores the evolution of digital systems from transistors to integrated circuits and their impact on consumer applications and IoT technologies.

Scaling Trends: Parallel Hardware Evolution

Explores the evolution of parallel hardware, from Moore's Law to the challenges of the 2000s, and the shift towards scale-out systems in data centers.

MOSFET Operation: Understanding NMOS Behavior

Explains the operation of NMOS structures and their behavior in various regimes, including sub-threshold, linear, and saturation.