Microscopy in situ and TEM Q&A

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Dynamical Scattering: Bend Contours

Explains the dynamical scattering effect of bend contours in TEM images of crystalline samples.

Analytical Electron Microscopy: Spectroscopy and Microanalysis

Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.

Electron Microscopy: In Situ

Explores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.

Electron Microscopy: EDS and ESEM

Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.

Advances in X-ray Energy Dispersive Spectroscopy

Explores advances in X-ray Energy Dispersive Spectroscopy in modern electron microscopy, emphasizing analytical sensitivity and detection limits.

Introduction to Transmission Electron Microscopy: History and Principles

Introduces transmission electron microscopy, covering its history, principles, and various contrast mechanisms used in imaging.

STEM & EDX

Covers the principles of electron microscopy, STEM, HAADF, EDX microanalysis, and applications in materials science.

Bragg's law: Transmission Microscopy

Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

Electron Diffraction: Crystallographic Structure Analysis

Covers the theory and applications of electron diffraction in materials science.