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STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

SEM Basics: Introduction to Electron Microscopy

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Scanning Electron Microscopy Basics

Covers the basics of Scanning Electron Microscopy, including working principles, image generation, signal production, and challenges.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

STEM: Scanning Transmission Electron Microscopy

Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Scanning Probe Microscopy: Fundamentals and Applications

Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.

SEM basics

Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.