Surface characterization: physical aspects

This lecture covers the physical aspects of surface characterization, focusing on surface morphology, topography, and specific surface area. Techniques such as STEM, SEM, STM, AFM, and profilometry are discussed for studying surface microgeometry and physical properties. The lecture explains the principles, resolutions, and applications of these techniques, highlighting the importance of understanding surface heterogeneities, topographic features, and material interactions. Various methods for surface studies, including electron tomography, contact and non-contact profilometry, and specific surface area determination using the BET model, are explored in detail.