Scanning Probe Microscopy: Basics and Applications

This lecture introduces Scanning Probe Microscopy (SPM), covering conventional microscopy, near-field interaction, different types of interactions between probe and surface, and the fabrication of sharp tips for Atomic Force Microscopy (AFM). It explains the principles behind SPM techniques, such as Scanning Tunneling Microscopy (STM) and AFM, highlighting the importance of tip sharpness and resolution. The lecture also discusses the microfabrication of nano-tips, drawing inspiration from natural erosion processes. Overall, it provides a comprehensive overview of SPM, its applications, and the significance of probe-surface interactions in nanoscale imaging and manipulation.