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Lecture
Testing of VLSI Systems
Description
This lecture covers the concepts of defects, errors, and faults in VLSI systems, including fault models, fault levels, and examples of defects in chips. It explains the challenges of scaling and complexity testing, functional vs. structural testing, and the single stuck-at fault model. The lecture also delves into fault equivalence, fault collapsing, and fault detection in NAND gates.
Official source
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