Testing of VLSI Systems

This lecture covers the concepts of defects, errors, and faults in VLSI systems, including fault models such as single stuck-at faults and bridging faults. It explains the difference between functional and structural testing, the issue of scaling and complexity, and the importance of fault collapsing and fault dominance. The lecture also discusses the challenges of multiple stuck-at faults, transistor-level faults, and the identification of redundancy and untestable faults.