Fault Simulation and Testability Analysis

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Related lectures (31)

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State-Space Representation: Structure Theorem

Covers the structure theorem for state-space representations and companion forms.

State-Space Representation: Controllability and Observability

Explores state-space representation, controllability, observability, and regulator calculation using the Ackermann method.

State-Space Representation: Basics & Transformations

Covers the basics of state-space representation and explores transformations to different forms.

Observability and Controllability

Explores observability and controllability in linear systems, emphasizing the significance of input decoupling for observability.

Built-In Self-Test (BIST): Techniques and Implementations

Explores Built-In Self-Test (BIST) techniques in VLSI systems, covering benefits, drawbacks, implementation details, and the use of Linear Feedback Shift Registers (LFSRs) for test pattern generation.

Simulation: Control of Dynamic Systems

Explores simulation of common structures and control of dynamic systems through friction and elasticity constants.

Testability Analysis: SCOAP Measures

Introduces SCOAP measures for testability analysis in VLSI systems, covering controllability, observability, and test vector length prediction.

Introduction to Logisim Evolution: Basics of Digital Circuit Design

Introduces Logisim Evolution, focusing on basic components for digital circuit design.

Controllability and Observability

Covers controllability and observability in linear systems, discussing necessary conditions and implications of unimodular matrices.

Logic Systems: TTL Gates and Analog Aspects

Explores TTL gates, analog aspects, and various logic gates in digital circuits.