Testing of VLSI Systems

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Related lectures (26)

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Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.

Test of VLSI Systems: Combinational and Sequential ATPG

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Solving Parity Games in Practice

Explores practical aspects of solving parity games, including winning strategies, algorithms, complexity, determinism, and heuristic approaches.

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Algorithmic Complexity: Definition and Examples

Explores algorithm correctness, worst-case complexity analysis, and efficiency comparison based on input size.

Logic Systems: TTL Gates and Analog Aspects

Explores TTL gates, analog aspects, and various logic gates in digital circuits.

Testing of VLSI Systems

Explores defects, errors, and faults in VLSI systems, including fault models and testing challenges.

Implementation Research: Concepts and Scope

Explores Implementation Research, addressing challenges in implementing health interventions and developing effective strategies for infectious diseases of poverty.

Path-Delay Fault Testing

Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.

Overfitting: Symptoms and Characteristics

Explores overfitting in polynomial regression, emphasizing the importance of generalization in machine learning and statistics.