Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
