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Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
Covers the basics of the reciprocal lattice in electron diffraction, including diffraction vector geometry and properties of reciprocal lattice unit cell vectors.
