Surface characterization: physical aspects

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STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Tomography: Imaging and Applications

Explores principles and applications of tomography, including 3D microscopy techniques and atomic-level material reconstruction.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Electron Diffraction: Crystallographic Structure Analysis

Covers the theory and applications of electron diffraction in materials science.

Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Advanced SEM Technologies and Examples

Explores advanced SEM technologies, low voltage imaging, high-resolution SEM, and analytical capabilities with practical examples.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.