Contacts: Semiconductor Devices II

Related lectures (32)

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Explores contact resistance in semiconductor devices, including Moore's Law, FET characteristics, quantum limits, and measurement techniques.

Explores contact resistance modeling in semiconductor devices, focusing on gate voltage calculation and defect analysis.

Covers the principles of ohmic contacts and their significance in semiconductor devices.

Introduces 2D materials, FETs, optoelectronics, post-CMOS concepts, and the historical impact of Moore's Law on semiconductor devices.

Covers the Schottky diode's structure, electrical characteristics, and modeling under various biasing conditions.

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

Describes the qualitative behavior of MOSFET transistors, focusing on their structure and operational principles.

Explains the operation of NMOS structures and their behavior in various regimes, including sub-threshold, linear, and saturation.

Delves into the evolution of transistors, the impact of quantum effects on nano-devices, and the functionality of memristors.

Explores contact resistance in semiconductor devices and methods to measure and extract it.