Test of VLSI Systems: Combinational and Sequential ATPG

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Digital Systems Overview: Evolution and Fundamentals

Explores the evolution of digital systems, covering basics like Boolean algebra and logic gates, and emphasizes teamwork skills and professional vocabulary.

Testing of VLSI Systems

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits using minterms, maxterms, and new gates like XOR and XNOR.

Testability Analysis: SCOAP Measures

Introduces SCOAP measures for testability analysis in VLSI systems, covering controllability, observability, and test vector length prediction.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits from functional descriptions and truth tables.

Path-Delay Fault Testing

Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.

Logic Systems: TTL Gates and Analog Aspects

Explores TTL gates, analog aspects, and various logic gates in digital circuits.

Digital Logic: Circuits and Design

Introduces digital logic, covering Boolean algebra, logic gates, combinational circuits, flip-flops, and state machines.

Logic Systems: Basics and Operators

Covers the basics of logic systems, including digital versus analog circuits, logic operators, truth tables, and Boolean algebra.

Introduction to Logisim Evolution: Basics of Digital Circuit Design

Introduces Logisim Evolution, focusing on basic components for digital circuit design.