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Scanning Probe Microscopy: Basics and Applications

Explores scanning probe microscopy fundamentals, tip types, and AFM modes for nanoscale imaging and manipulation.

Atomic Force Microscopy: Nanoscale Metrology

Explores Atomic Force Microscopy, covering principles, applications, resolution, feedback mechanisms, and imaging techniques.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.

Surface characterization: physical aspects

Explores surface morphology, topography, and specific surface area using advanced techniques for material characterization.

Scanning Probe Microscopy

Covers the principles and applications of Scanning Probe Microscopy, including working principles, different systems, and imaging applications.