Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.
Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores advanced SEM techniques and FIB technology for imaging and sample preparation.
