Lecture
Scanning Electron Microscopy Basics
Related lectures (83)
Advanced TEM Operation
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Dose Management in Electron Microscopy
Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.
SEM basics
Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.
Scanning Electron Microscopy: Fundamentals and Applications
Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.
Image Processing Fundamentals
Covers scientific image processing fundamentals, software practices, and ethical considerations in image processing.
Electron Microscopy Components
Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.
Image Processing Fundamentals
Covers the basics of image processing for microscopy, including acquiring, correcting defects, enhancing images, and extracting information.
Beam-Matter Interactions
Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.
Advanced SEM Technologies and Examples
Explores advanced SEM technologies, low voltage imaging, high-resolution SEM, and analytical capabilities with practical examples.
Transmission Electron Microscopy Basics
Introduces the basics of Transmission Electron Microscopy, covering TEM user interface, camera settings, vacuum overview, and image analysis.