Lecture
Testing of VLSI Systems
Related lectures (42)
Karnaugh Maps: Grouping Techniques
Explores Karnaugh maps, grouping rules, and transistor logic in logic systems.
Logic Systems: TTL Gates and Analog Aspects
Explores TTL gates, analog aspects, and various logic gates in digital circuits.
VLSI Testing: Techniques and Economics
Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.
Legal Aspects of Architectural Contracts
Explores the legal framework of architectural contracts, emphasizing the importance of understanding obligations and responsibilities in construction projects.
Photodiodes: Operation and Characteristics
Explores the operation and characteristics of photodiodes, including load resistance, junction capacitance, and sensitivity.
Ceramic Forming Methods: Drying & Binder Removal
Explores ceramic forming methods, emphasizing particle packing, compaction, additives, ejection, and slip casting practical aspects.
Defects: Structure and Stability
Explores the structure and stability of defects in crystals, emphasizing their impact on material properties.
Vortex Pinning: Energy Landscape and Elasticity
Explores vortex pinning in superconductors, focusing on energy landscape creation and vortex elasticity.
Integrity of Joints & Metal Additive Manufacturing
Covers the integrity of joints, typical defects, failure modes, and metal additive manufacturing techniques.
Pile Defects and Controls
Explores potential defects in pile foundations and methods for their control during and after construction.