Testing of VLSI Systems

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Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.

Testing of VLSI Systems

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

Logical Effort: Fundamentals of VLSI Design

Covers the Logical Effort method for optimizing logic delay and gate sizing impact.

Semiconductor Devices II: Defects Engineering

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

VLSI Testing: Techniques and Economics

Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.

Simulation of 2D Field Effect Transistors

Covers the simulation of 2D Field Effect Transistors and the advantages of using Green's Function.

Logic Gates and IC Technology

Explores the implementation of logic gates in semiconductor material, focusing on TTL and CMOS technologies, ICs, hazards, clocks, D flip-flops, and switch debouncing.

Fracture Mechanics: Defects and Energy

Explores fracture mechanics, defects, stress factors, and energy release in material fracture.

Configurational Forces: Defects in Materials

Explores configurational forces in materials, emphasizing equilibrium conditions and defect interactions.

Materials Modelling: From Prediction to Design

Explores materials modelling, focusing on predicting and designing material properties through computation, including defect analysis, coherence time calculations, and quantum simulations.