Publication

Influence of shot noise on phase measurement accuracy in digital holographic microscopy

Related publications (42)

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

SoDaCam: Software-defined Cameras via Single-Photon Imaging

Edoardo Charbon, Andrei Ardelean, Mohit Gupta

Reinterpretable cameras are defined by their post-processing capabilities that exceed traditional imaging. We present "SoDaCam" that provides reinterpretable cameras at the granularity of photons, from photon-cubes acquired by single-photon devices. Photon ...

Ieee Computer Soc2023

Modeling for Ultra Low Noise CMOS Image Sensors

Raffaele Capoccia

The low-light performance of a CMOS image sensor (CIS) is one of the most important performance metrics in a camera, whether it is used in products for consumer electronics or in an image-acquisition system for machine vision or the Internet-of-Things (IoT ...

EPFL2020

An Ultra Low-Noise Micropower PPG Sensor

Antonino Caizzone

Nowadays, efficient and remote health monitoring is becoming increasingly important, given both the ageing of population and the combined action of an increase in obesity level and cardiovascular diseases. The healthcare industry is becoming more reliant o ...

EPFL2020

Wide-field time-gated phasor analysis of visible fluorescence through highly scattering medium

Edoardo Charbon, Claudio Bruschini, Arin Can Ülkü

Fluorescence sensing is an invaluable research tool in life science and biomedical imaging. Despite its major use and advantages, it mainly remains a tool for in vitro studies since exist fluorophores mainly absorb and emit light in the visible region, in ...

2020

Compact lensless digital holography

Manon Rostykus

Microscopy is of high interest for biology since it allows imaging features that are too small to be seen with naked eyes. However, cells are mostly transparent to visible and infrared light which makes it difficult to see with a traditional microscope. To ...

EPFL2018

Compact Side and Multi Angle Illumination Lensless Imager and Method of Operating the Same

Christophe Moser, Manon Rostykus

A system for subpixel resolution imaging of an amplitude and quantitative phase image, the system including a waveguide having a top plane, a bottom plane, and two sides, an array of light sources emitting first befit beams from one side of the two sides o ...

2017

Direct unwrapped phase estimation in phase shifting interferometry using Levenberg-Marquardt algorithm

Pramod Rastogi, Rishikesh Dilip Kulkarni

An algorithm for the direct unwrapped phase estimation from the linearly phase shifted interferograms is presented. The temporal fringe intensity along each pixel is represented as a function of fringe amplitude, phase step and the searched phase. These pa ...

Iop Publishing Ltd2017

Nonuniformity Analysis of a 65-kpixel CMOS SPAD Imager

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic, Samuel Burri

While CMOS single-photon avalanche diode (SPAD) technology has steadily advanced, improving noise, timing resolution, and sensitivity, spatial resolution has been increasing as well. The increase in the number of pixels has made a comprehensive analysis of ...

IEEE-Inst Electrical Electronics Engineers Inc2016

Ultra Low Noise CMOS Image Sensors

Assim Boukhayma

CMOS Image Sensors (CIS) overtook the charge coupled devices (CCDs) in low noise performance. Photoelectron counting capability is the next step for CIS for ultimate low light performance and new imaging paradigms. This work presents a review of CMOS image ...

EPFL2016

Sub-electron CIS noise analysis in 65 nm process

Christian Enz, Assim Boukhayma, Raffaele Capoccia

For a 4T pixel-based CMOS image sensors (CIS) readout chain, with column-level amplification and CDS, we show that the input-referred total noise in a standard 65 nm process can be reduced to 0.37 e-rms. Based on transient noise simulation using Eldo, the ...

2016