Publication
High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc
Related publications (90)
Fabrication and Testing of a MEMS Based Earth Sensor
We present a novel MEMS inertial sensor that directly measures the gravity gradient in order to sense the relative orientation of a satellite with respect to the Earth. An Earths ensor provides an orbiting satellite with a vector towards the Earth center. ...
2009Interferometric Measurement on a Nanometric Length Scale
Hans Peter Herzig, Toralf Scharf, Myun Sik Kim
We investigate a measurement technique based on High Resolution Interference Microscopy (HRIM). HRIM allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanome ...
2008Advantages of digital holographic microscopy for real-time full field absolute phase imaging
Christian Depeursinge, Tristan Colomb, Pierre Marquet, Jonas Kühn, Florian Charrière
Different interferometric techniques were developed last decade to obtain full field, quantitative, and absolute phase imaging, such as phase-shifting, Fourier phase microscopy, Hilbert phase microscopy or digital holographic microscopy (DHM). Although, th ...
SPIE2008Fast focus field calculations
Theo Lasser, Marcel Leutenegger, Rainer Leitgeb
We present a method for fast calculation of the electromagnetic field near the focus of an objective with a high numerical aperture (NA). Instead of direct integration, the vectorial Debye diffraction integral is evaluated with the fast Fourier transform f ...
2008A Micro-Electrode Array device coupled to a laser-based system for the local stimulation of neurons by optical release of glutamate
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Elsevier2008A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors
Majed Chergui, Andrea Callegari, Jinquan Liu
We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in at. force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, th ...
2008Fast focus field calculations
Theo Lasser, Marcel Leutenegger, Rainer Leitgeb
We present a method for fast calculation of the electromagnetic field near the focus of an objective with a high numerical aperture (NA). Instead of direct integration, the vectorial Debye diffraction integral is evaluated with the fast Fourier transform f ...
SPIE2008Fourier Domain Optical Coherence Microscopy with Extended Depth of Field
Theo Lasser, Cathrin Brisken, Yann Barrandon, Marcel Leutenegger, Rainer Leitgeb, Martin Villiger, Adrian Bachmann, Joan Goulley, Lukas Steinmann
Fourier Domain Optical Coherence Tomography (FDOCT) is a high speed biomedical imaging modality which extracts the sample structure in depth. The axial resolution is given by the coherence length of the employed light source. The lateral resolution on the ...
2008Near-field optical images of subwavelength annular aperture arrays exhibiting an extraordinary transmission
Patrik Willi Hoffmann, Christian Santschi
In this paper, we present near-field optical images of nanostructures exhibiting an extraordinary transmission. These structures consist of annular aperture arrays engraved in a metallic film: they are quite promising structures for nanophotonics because o ...
2008Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution
Christian Depeursinge, Tristan Colomb, Etienne Cuche, Frédéric Montfort, Christophe Pache, Pierre Marquet, Jonas Kühn, Florian Charrière
We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique ...
SPIE2008