Publications related to Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

FinFET integrated low-power circuits for enhanced sensing applications

Mihai Adrian Ionescu, Antonios Bazigos, Alexandru Rusu, Sara Rigante, Paolo Livi

This work presents different circuit architectures that combine sensing and signal readout functions. The basic building block is a Fin Field-Effect Transistor (Fin-FET) used as both sensor and metal gate transistor. Moreover, a hybrid partially gated FinF ...

Elsevier2013

Polarity Control in Double-Gate, Gate-All-Around Vertically Stacked Silicon Nanowire FETs

Giovanni De Micheli, Davide Sacchetto, Yusuf Leblebici, Pierre-Emmanuel Julien Marc Gaillardon, Jian Zhang, Michele De Marchi

We fabricated and characterized ambipolar Silicon Nanowire (SiNW) FET transistors featuring two independent Gate-All-Around (GAA) electrodes and vertically stacked SiNW channels. One of the gate electrodes is exploited to dynamically select the polarity of ...

2012

Uniaxially tensile strained accumulation-mode gate-all-around Si nanowire nMOSFETs

Mihai Adrian Ionescu, Didier Bouvet, Wladyslaw Grabinski, Mohammad Najmzadeh

In this work we report an experimental study on accumulation-mode (AM) gate-all-around (GAA) nMOSFETs based on silicon nanowires with uniaxial tensile strain. Their electrical characteristics are studied from room temperature up to ~400 K and carrier mobil ...

2011

Low-Noise Microwave Performance of 0.1 mu m Gate AlInN/GaN HEMTs on SiC

Nicolas Grandjean, Jean-François Carlin, Eric Feltin, Marcus Gonschorek

We report the first microwave noise characterization of AlInN/GaN HEMTs. Transistors with a 0.1 mu m gate implemented on a semi-insulating SiC substrate achieve a maximum current density of 1.92 A/mm at V-GS = 0 V, a measured transconductance g(M) = 480 mS ...

2010

Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

Maher Kayal, Marc Pastre

This paper presents a methodology for digitally calibrating analog circuits and systems. Based on the detection of an imperfection by a simple comparator, a successive approximations algorithm tunes a compensation current. The latter is generated by a sub- ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009

Control of Ferromagnetism in a (Ga,Mn)As - Based Multiferroic System via a Ferroelectric Gate

Nava Setter, Igor Stolichnov, Harry Joseph Trodahl, Sebastian Riester

We report the implementation of a ferroelectric gate field effect transistor (FeFET) with a ferromagnetic (Ga,Mn)As conducting channel. The Curie temperature T-C in the channel is modulated by non-volatile poling of the gate. The ferroelectric state, and t ...

Amer Inst Physics, 2 Huntington Quadrangle, Ste 1No1 D, Melville, Ny 11747-4501 Usa2009

Prospects for logic-on-a-wire

Giovanni De Micheli, Mihai Adrian Ionescu, David Atienza Alonso, Didier Bouvet, Kirsten Emilie Moselund, Yusuf Leblebici, Mohamed Haykel Ben Jamaa

In this paper we present the top-down fabrication of gate-all-around (GAA) and body-tied @W-gate devices by a combination of etching and oxidation steps resulting in a local silicon-on-insulator structure. The GAA has advantages in terms of enhanced curren ...

2008

Design for Reliability of Nanometer-Scale Electronics under High Defect Density

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

High defect density exhibited by nanoelectronic technologies, and parameter variability already affecting the operation of very-deep submicron CMOS systems demand for a combination of specific solutions, focusing at each various levels of abstraction in th ...

2006

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Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

FinFET integrated low-power circuits for enhanced sensing applications

Polarity Control in Double-Gate, Gate-All-Around Vertically Stacked Silicon Nanowire FETs

Uniaxially tensile strained accumulation-mode gate-all-around Si nanowire nMOSFETs

Generalized Airport Gate Assignment

Pre-Synthesis Optimization of Arithmetic Circuits

Low-Noise Microwave Performance of 0.1 mu m Gate AlInN/GaN HEMTs on SiC

Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

Control of Ferromagnetism in a (Ga,Mn)As - Based Multiferroic System via a Ferroelectric Gate

Prospects for logic-on-a-wire

Design for Reliability of Nanometer-Scale Electronics under High Defect Density

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Uniaxially tensile strained accumulation-mode gate-all-around Si nanowire nMOSFETs

Low-Noise Microwave Performance of 0.1 mu m Gate AlInN/GaN HEMTs on SiC

FinFET integrated low-power circuits for enhanced sensing applications

Control of Ferromagnetism in a (Ga,Mn)As - Based Multiferroic System via a Ferroelectric Gate

Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

Design for Reliability of Nanometer-Scale Electronics under High Defect Density

Polarity Control in Double-Gate, Gate-All-Around Vertically Stacked Silicon Nanowire FETs

Generalized Airport Gate Assignment

Pre-Synthesis Optimization of Arithmetic Circuits

Prospects for logic-on-a-wire