Publication

Avalanche Microwave Noise Sources in Commercial 90-nm CMOS Technology

Related publications (49)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Avalanche Microwave Noise Sources in Commercial 90-nm CMOS Technology

Graph Chatbot

Chat with Graph Search

Silicon CMOS and InGaAs(P)/InP SPADs for NIR/SWIR detection

Doping Engineering for PDP Optimization in SPADs Implemented in 55-nm BCD Process

Fab-to-fab and run-to-run variability in 130 nm and 65 nm CMOS technologies exposed to ultra-high TID

Sensitivity, Noise and Resolution in a B -Modified Foundry-Made ISFET with Miniaturized Reference Electrode for Wearable Point-of-Care Applications

Adaptive Body Biasing in Strong Body Factor Technologies

Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55nm BCD Process

Polarity-Controllable Devices and Circuits for Doping-Free 2D Electronics

Negative Capacitance as Universal Digital and Analog Performance Booster for Complementary MOS Transistors

Exploration of Negative Capacitance Devices and Technologies

Phasor-based widefield FLIM using a gated 512×512 single-photon SPAD imager