STEM: Scanning Transmission Electron Microscopy

In course

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Description

This lecture covers the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy. Topics include TEM diffraction, sample modes, detectors, diffraction contrast, HAADF versus HRTEM, EDS analysis, and STEM-EDS combination for quantitative mapping.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_7okpqlay

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Chemical engineering

Nanotechnology: Topics in nanotechnology

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