Test of VLSI Systems

This lecture introduces the analysis and implementation of test techniques for digital VLSI systems, covering topics such as test economics, automatic test equipment, and design for testability. Students will learn about fault modeling, fault simulation, and measures of testability, as well as the necessity of VLSI testing and popular IC testing algorithms. The course also includes hands-on computer laboratory sessions and an overview of test EDA software tools. Various defects in integrated circuits are discussed, along with the importance of verification and testing in the IC fabrication process. The lecture emphasizes the economic impact of testing and the challenges posed by the complexity and scale of modern ICs.

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EE-530: Test of VLSI systems

Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test technique

Integrated circuit

An integrated circuit or monolithic integrated circuit (also referred to as an IC, a chip, or a microchip) is a set of electronic circuits on one small flat piece (or "chip") of semiconductor material, usually silicon. Large numbers of miniaturized transistors and other electronic components are integrated together on the chip. This results in circuits that are orders of magnitude smaller, faster, and less expensive than those constructed of discrete components, allowing a large transistor count.

Comparison of EDA software

This page is a comparison of electronic design automation (EDA) software which is used today to design the near totality of electronic devices. Modern electronic devices are too complex to be designed without the help of a computer. Electronic devices may consist of integrated circuits (ICs), printed circuit boards (PCBs), field-programmable gate arrays (FPGAs) or a combination of them. Integrated circuits may consist of a combination of digital and analog circuits.

Complexity class

In computational complexity theory, a complexity class is a set of computational problems "of related resource-based complexity". The two most commonly analyzed resources are time and memory. In general, a complexity class is defined in terms of a type of computational problem, a model of computation, and a bounded resource like time or memory. In particular, most complexity classes consist of decision problems that are solvable with a Turing machine, and are differentiated by their time or space (memory) requirements.

Computational complexity

In computer science, the computational complexity or simply complexity of an algorithm is the amount of resources required to run it. Particular focus is given to computation time (generally measured by the number of needed elementary operations) and memory storage requirements. The complexity of a problem is the complexity of the best algorithms that allow solving the problem. The study of the complexity of explicitly given algorithms is called analysis of algorithms, while the study of the complexity of problems is called computational complexity theory.

Three-dimensional integrated circuit

A three-dimensional integrated circuit (3D IC) is a MOS (metal-oxide semiconductor) integrated circuit (IC) manufactured by stacking as many as 16 or more ICs and interconnecting them vertically using, for instance, through-silicon vias (TSVs) or Cu-Cu connections, so that they behave as a single device to achieve performance improvements at reduced power and smaller footprint than conventional two dimensional processes. The 3D IC is one of several 3D integration schemes that exploit the z-direction to achieve electrical performance benefits in microelectronics and nanoelectronics.

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.

Explores defects, errors, and faults in VLSI systems, including fault models and testing challenges.

Explores the RTL design flow, chip-level integration, standard cells, and static timing analysis in VLSI design.

Explores the roles of testing in VLSI systems, different testing methodologies, cost analysis, factors affecting yield, and the importance of testing in modern technologies.