Nanoscale AFM: Microscopy and Techniques

This lecture introduces the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology. Starting with the need for nanoscale microscopy, the instructor covers the scale of natural and manmade objects, the diffraction limit, and the achievable resolution in microscopy. The lecture delves into the working principles of AFM, including imaging modes like contact, tapping, and non-contact modes. It explains the challenges in measuring small objects, the importance of feedback mechanisms, and the various forces involved in tip-sample interactions. Additionally, it explores dynamic modes, force curves, and the fabrication of cantilevers. The lecture concludes with a discussion on AFM image processing, artefacts, and tips for obtaining accurate results.