Lecture

Advanced SEM & FIB

Description

This lecture covers advanced scanning electron microscopy (SEM) techniques, including low voltage imaging, detectors, and analytical SEM. It also explores the principles and applications of focused ion beam (FIB) technology for imaging, milling, and TEM sample preparation.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.