Built-In Self-Test (BIST): Techniques and Implementations

This lecture covers the concept of Built-In Self-Test (BIST) in VLSI systems, focusing on techniques and circuit configurations that enable a circuit to test itself. It discusses the benefits of BIST, such as improved controllability and observability, reduced reliance on external test equipment, and concurrent testing during normal system operation. The drawbacks and costs of BIST, including area overhead, timing issues, and development challenges, are also explored. The lecture delves into the detailed implementation of BIST, including test result analysis, test pattern generation, and the role of various components like Test Pattern Generator (TPG) and Response Analyzer (RA). Additionally, it explains the use of Linear Feedback Shift Registers (LFSRs) for test pattern generation and the importance of primitive polynomials in generating pseudo-random sequences.