Lectures related to Design for testing

Covers the D-calculus and implication procedures for fault detection in VLSI systems.

Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Explores test vector generation, ATPG algorithms, fault coverage, and path sensitization in VLSI systems.

Explores defects, errors, and faults in VLSI systems, including fault models and testing challenges.

Explores the evolution of hardware systems, from transistors to modern parallelism and the challenges of power limitations.

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.