Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explains the operation of the Atomic Force Microscope for imaging insulating surfaces and discusses the differences with the Magnetic Force Microscope.
Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.
