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Explores control and sensitivity analysis of an Atomic Force Microscope, emphasizing the importance of high gain for reducing sensitivity at resonance.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
Explores Scanning Probe Lithography for nanometer-scale patterning techniques and its applications in AFM exposure, DPN, and local field enhanced oxidation.
Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
