Plasma Focused Ion Beam: Applications and Techniques

This lecture covers the principles and applications of Plasma Focused Ion Beam (PFIB) technology, focusing on high-precision imaging and milling techniques using a Helios G4 PFIB system. Topics include SEM and FIB column components, gas injection systems, electrical property studies, and automated system checks. The instructor, Carsten Putzke, demonstrates the use of MultiGIS for material deposition, EasyLift for sample handling, and automated irradiation studies. The lecture emphasizes the importance of accurate sample positioning and system maintenance for optimal results.