Scanning Probe Microscopy: Fundamentals

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Atomic Force Microscopy: Nanoscale Metrology

Explores Atomic Force Microscopy, covering principles, applications, resolution, feedback mechanisms, and imaging techniques.

Atomic Resolution Techniques

Covers synchrotrons, x-ray lasers, and atomic resolution techniques like Cryo-EM and scanning tunneling microscopy.

Biomicroscopy II: Logistics

Covers theory and hands-on experience with optical microscopes and advanced microscopy methods.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Scanning probe microscopy: basics

Covers the basics of Scanning Probe Microscopy, focusing on STM and AFM, explaining principles, imaging techniques, and spectroscopy methods.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Scanning Probe Microscopy: AFM Basics

Covers the basics of scanning probe microscopy, with a focus on the Atomic Force Microscope (AFM) and its operational principles.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.

Scanning Probe Microscopy: Advanced Modes

Explores advanced modes of AFM, high-speed imaging, MEM, SNOM, and a variety of SPM techniques.

Scanning Probe Microscopy: Fundamentals and Applications

Explores the fundamentals and applications of scanning probe microscopy techniques, including AFM, MFM, KPFM, and SNOM.