Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores the history of Transmission Electron Microscopy and the advancements in aberration correction techniques, discussing various contrasts in TEM imaging.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
