Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
