Scanning Probe Microscopy: AFM Basics

About
Privacy
Disclaimer

Graph Chatbot

Related lectures (31)

Page 2 of 4

Scanning Probe Microscopy: Advanced Modes

Explores advanced modes of AFM, high-speed imaging, MEM, SNOM, and a variety of SPM techniques.

Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Microscopy: Imaging Systems and Techniques

Covers the fundamentals of microscopy, including lens functioning, image creation, and advanced techniques like fluorescence and super resolution.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Piezo Scanner and STM

Explores piezo scanners, STM feedback, and challenges in achieving nanometer resolution for high-quality imaging.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.

Microscopy and Imaging Systems

Covers the fundamental concepts of microscopy, explaining the need for magnification beyond the human eye and introducing advanced imaging techniques.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Optical Microscopy: Techniques and Applications

Explores optical microscopy techniques, dimension measurements, surface profiling, electrical characterization of MEMS, and advanced microscopy techniques.

Untitled