Covers the basics of Scanning Probe Microscopy, focusing on STM and AFM, explaining principles, imaging techniques, and spectroscopy methods.
Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.
Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.
Explores light microscopy principles, fluorescent proteins, optical slicing, and modulation transfer functions in cellular imaging.
