Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
