X-ray Free-Electron Lasers: Characteristics and Architecture

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Explores free electron lasers, covering light sources, brilliance, X-ray sources, FEL modes, and electron beam requirements.

Advanced SEM Technologies and Examples

Explores advanced SEM technologies, detectors, and specimen preparation for high-resolution imaging and analytical capabilities.

Electron Beam Lithography: Tool Overview

Explores Electron Beam Lithography (EBL), its tool overview, vacuum levels, electron sources, and guns for sub-20 nm feature fabrication.

Advanced SEM Technologies and Examples

Explores advanced SEM technologies, low voltage imaging, high-resolution SEM, and analytical capabilities with practical examples.

Wigglers and Undulators: Tuning Photon Energy and Polarization

Covers tuning photon energy, selecting desired energy, varying polarization, APPLE undulators, and rapid switching.

SEM Basics: Introduction to Electron Microscopy

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Chemical Analysis: X-Ray Micro-Analysis XRMA

Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.

STEM and EDX

Covers STEM and EDX principles, X-ray generation, quantification methods, and analytical TEM applications.

Chemical analysis: X-Ray photoelectron spectrometry

Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.

Microstructure Characterization by SEM

Explores Microstructure Characterization by Scanning Electron Microscopy, covering interactions, morphology study, EDX analysis, and phase distribution.